












illuminated uniformly such that the optical generation rate
is
throughout the sample. The incident radiation is turned off at 𝑡=0.
Assume low-level injection to be valid and ignore surface effects. The carrier lifetimes are 



in kW offered by the n-channel
MOSFET M shown in the figure below, at a bias point of VB = 2V is (device
data for M: device transconductance parameter
, threshold voltage VTN = 1V, and neglect body effect and channel length
modulation effects)